New tool for nanoobject spectroscopy

Peter Guttmann, Carla Bittencourt, Stefan Rehbein, Polona Umek, Xiaoxing Ke, Gustaaf Van Tendeloo, Chris P. Ewels & Gerd Schneider reported a scheme that combines the high spatial resolution of full-field transmission X-ray microscopy (TXM) with high-spectral-resolution near-edge X-ray absorption fine structure (NEXAFS). The idea could lead to a wide range of new material studies that combine high-resolution spectroscopic techniques with nanoscale tomographic imaging.

"Nanoscale spectroscopy with polarized X-rays by NEXAFS-TXM"

Published online: 27 November 2011 | doi:10.1038/nphoton.2011.268

1 December 2011