Miro Haluska

Name Miro Haluska
Work Groups Work Group 1 - Synthesis
Work Group 3 - Devices
Laboratory Micro and Nanosystems
Organisation ETH Zurich
Website http://www.micro.mavt.ethz.ch
Areas of Research growth of carbon nanotubes
Research Keywords carbon nanotube, CVD, gas sensors

Areas of Future Interest utilization of CNTs in sensors

Selected Publications:

Brief CV
Miro Haluška received his Electrical Engineering diploma from the Slovak Technical University in Bratislava. He gained a doctor degree in physics from the University of Vienna with a thesis entitled "Analysis of the growth process and characterization of fullerite single crystals prepared from the vapor phase". He worked as a postdoc and visiting researcher at Max Planck Institute for Solid State Research and Max Planck Institute for Metal Research, both in Stuttgart, and at the Laboratory for Nanotechnology at the Department of Material Science and Engineering of the Clemson University in South Carolina mostly on topics of hydrogen storage in carbon nanostructures and the growth of carbon nanotubes. From 2007 to 2009, he worked in the Micro and Nano Scale Engineering group at the Department of Mechanical Engineering at the Eindhoven University of Technology. His research activities were connected to the local growth of carbon nanotube assemblies utilizing a laser activated chemical vapor deposition method as well as characterization of carbon nanostructures. In May 2009, he joined the Group of Micro and Nanosystems of Professor Dr. Christofer Hierold at the Department of Mechanical and Process Engineering of ETH Zurich. His current research activities are focused on targeted growth of SWCNTs for their application in sensors and improvements of nanotube-metal contacts.

Materials: - carbon nanostructures

Techniques: - - Raman spectroscopy
- scanning electron microscopy
- thermal gravimetric analysis
- temperature desorption spectroscopy
- volumetry
- differential scanning calorimetry
- microhardness and dynamical nanoindentation
- continuous-wave ultrasound resonant technique
- atomic force microscopy
- deep level transient/charge transient spectroscopy