Rolf Erni
| Name | Rolf Erni |
| Work Groups |
Work Group 2 - Characterisation |
| Laboratory | Electron Microscopy Center |
| Organisation | Swiss Federal Laboratories for Materials Testing and Research |
| Website | http://www.empa.ch/emc |
| Areas of Research | TEM, STEM, aberration correction, CNTs, graphene |
| Research Keywords | TEM, STEM, EELS, VEELS, interfaces, defects, sp2 materials |
| Areas of Future Interest | TEM, STEM, aberration correction, CNTs, graphene, interfaces |
Selected Publications:
- Graphene at the Edge: Stability and Dynamics
- Valence electron energy-loss spectroscopy in monochromated scanning transmission electron microscopy
- Atomic-Resolution Imaging with a Sub-50-pm Electron Probe
- Direct Imaging of Lattice Atoms and Topological Defects in Graphene Membranes
- Local indium segregation and bang gap variations in high efficiency green light emitting InGaN/GaN diodes
Brief CV
Rolf Erni received his doctoral degree from the Swiss Federal Institute of Technology Zurich (ETH Zurich) at the Institute of Applied Physics. He carried out postdoctoral studies at the University of California at Davis and at the National Center for Electron Microscopy (NCEM), Lawrence Berkeley National Laboratory. He then joined FEI Company as a high-end application specialist and was later in the role of a senior system engineer. Before returning to NCEM as a staff scientist, he spent a period of time as a faculty member at the
EMAT institute (Electron Microscopy for Materials Science) of the University of Antwerp. Rolf is now head of the Electron Microscopy Center of the Swiss Federal Laboratories for Materials Testing and Research (Empa).
His research interests cover various
topics in electron microscopy, such as ultra-high resolution and low-voltage electron microscopy imaging as well as valence electron energy-loss spectroscopy. The functionalization of carbon-based nanomaterials (graphene, CNTs) is one particular aspect his research focus onto. There, the detailed characterization of interfaces between carbon nanomaterials and the respective host materials are of decisive importance to warrant any device performance. This is a topic that can be addressed by analytical electron microscopy.