Luca Petaccia
| Name | Luca Petaccia |
| Work Groups |
Work Group 2 - Characterisation |
| Laboratory | Elettra Synchrotron Light Laboratory |
| Organisation | Sincrotrone Trieste |
| Website | http://www.elettra.trieste.it/PEOPLE/index.php?n=LucaPetaccia.HomePage |
| Areas of Research | electronic and chemical properties of low-dimensional structures, superconductors and strongly correlated systems, bulk photoemission spectroscopy |
| Research Keywords | nanotubes, fullerenes, graphene, metallic clusters, gas interaction, synchrotron radiation, bulk photoemission spectroscopy |
| Areas of Future Interest | functionalization of carbon nanostructures, oxides, bulk photoemission spectroscopy |
Selected Publications:
- Band dispersion in the deep 1s core level of graphene
- Sensing gases with carbon nanotubes: a review of the actual situation
- Atomic oxygen functionalization of double walled C nanotubes
- A Spectroscopic and ab initio study of the formation of graphite and carbon nanotubes from thermal decomposition of silicon carbide
- The role of metal contact in the sensitivity of single-walled carbon nanotubes to NO2
Brief CV
Luca Petaccia has a PhD in Physics. He joined Elettra (Sincrotrone Trieste) in December 2001 as staff scientist at the SuperESCA beamline. Since April 2007, he is responsible for operations, scientific and technical activities of the new beamline BaD ElPh for low-energy high-resolution photoemission spectroscopy.
Areas of expertise: electronic, chemical and structural properties of low-dimensional materials; surface reactions; phase transitions; metal-semiconductor and organic-inorganic interfaces; growth of thin films, C nanostructures and metallic clusters.
Prior experience: characterization of the electronic, chemical and structural properties of low-dimensional materials by means of synchrotron radiation techniques.
Specialist techniques: high-resolution photoemission (PES) and angle-resolved photoemission spectroscopy (ARPES), photoelectron diffraction (PED), near-edge x-ray absorption spectroscopy (NEXAFS), high-resolution electron energy loss spectroscopy (HREELS), Auger spectroscopy (AES), and low energy electron diffraction (LEED).
Materials: carbon nanostructures, organic and metallic films, semiconductors and metals, superconductors and strongly correlated systems.